Study and application of the 8K ADC block method in a successive approximation
using new generation electronics components with variable time and fast acquisition of 2.2
μs. This is the most effective method has been focused on research, exploitation to
fabricate instrument according to specific objectives: successive approximation ADC,
Configuration for channel width uncertainty, D/ A conversion. Based on that, the ADC unit
has formed and put into practical application in training. The works presented tests,
discussed the experimental results of measuring and checking the parameters and technical
specifications of the instrument. Specifically, the technical characteristics of the equipment
to be tested; configuration of the reference standard system (RSS) with the system to be
evaluated (SUT) for data acquisition and calibration; the results was discussed. It can be
said that the new point of academic work is research, successful application of analog
signal conversion method of radiation events by successive approximation register (SAR)
techniques. To solve this problem, the project incorporates the use of fast-conversion
device (2.2 μs/13 bits) with external circuits to offset channel width uncertainty to improve
the resolution of the instrument.
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TRƯỜNG ĐẠI HỌC SƯ PHẠM TP HỒ CHÍ MINH
TẠP CHÍ KHOA HỌC
HO CHI MINH CITY UNIVERSITY OF EDUCATION
JOURNAL OF SCIENCE
ISSN:
1859-3100
KHOA HỌC TỰ NHIÊN VÀ CÔNG NGHỆ
Tập 15, Số 3 (2018): 11-23
NATURAL SCIENCES AND TECHNOLOGY
Vol. 15, No. 3 (2018): 11-23
Email: tapchikhoahoc@hcmue.edu.vn; Website:
11
STUDY AND CONSTRUCTION OF A SUCCESSIVE APPROXIMATION
ADC8K FOR MULTICHANNEL ANALYZER SYSTEM
Dang Lanh1*, Nguyen An Son1, Le Doan Dinh Duc2
1DaLat University, Lam Dong
2Dalat Vocational training collect, Lam Dong
Received: 18/12/2017; Revised: 08/02/2018; Accepted: 26/3/2018
ABSTRACT
Multi-channel Analyzer (MCA) is one of very essential equipment in nuclear physics and
nuclear engineering for the measurement of ionization radiation. Generally, an MCA system
consists of radiation detector, amplifier system, ADC circuit, and MCD connected with computer
for data processing. Among them, ADC is a functional electronic block, which plays an important
role for converting analog to digital signals. Corresponding to the domestic needs in development
of nuclear instruments, this work presents a design and construction of an ADC8K module with
successive approximation method. Some experimental results are as follows: Differential non-
linearity (DNL%) = 1.42, Integral non-linearity (INL% = 0.58), and χ2 = 8.109 proved that
mentioned system can be used with considerable reliability in practical nuclear engineering.
Keywords: DNL, INL, χ2, Successive approximation.
TÓM TẮT
Nghiên cứu và xây dựng khối ADC8K xấp xỉ liên tiếp dùng trong hệ máy phân tích đa kênh
Hệ máy phân tích đa kênh (MCA) dùng trong ghi đo bức xạ ion hóa là một trong những hệ
thống thiết bị rất cần thiết trong nghiên cứu vật lí và kĩ thuật hạt nhân. Một hệ MCA hiện nay thường
bao gồm đầu dò, bộ khuếch đại, mạch ADC, mạch MCD ghép nối máy tính để xử lí kết quả đo; trong
đó, mạch ADC đóng vai trò quan trọng trong việc chuyển đổi tín hiệu tương tự thành tín hiệu số. Bài
báo này trình bày việc nghiên cứu xây dựng khối ADC8K theo phương pháp biến đổi xấp xỉ liên tiếp.
Các tham số đặc trưng kĩ thuật đạt được bao gồm: độ phi tuyến vi phân (DNL% = 1.42), độ phi tuyến
tích phân (INL% = 0.58), χ2 = 8.109 minh chứng hệ thống có thể ứng dụng khả thi trong các nghiên
cứu thực nghiệm trong lĩnh vực kĩ thuật hạt nhân.
Từ khóa: DNL, INL, χ2, xấp xỉ liên tiếp.
1. Introduction
Da Lat University is in charge of specialized training in nuclear engineering, but the
equipment used in research and experimental measurement is not fully equipped and needs
to be supplemented. Therefore, the construction of multi-channel analysis systems,
gamma-ray measurement and experiments to improve the level of research for students and
graduate students in the field of engineering physics is one of the urgent needs. At present,
* Email: lanhd@dlu.edu.vn
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the orientations of research in the field of Engineering Physics are aimed at improving
knowledge and skills in design and fabricate of nuclear equipment, gamma radiation
measurement and exploitation and operation of experimental equipment. The design and
fabricate of gamma spectrometer using high-quality radiation detector will support the
method of constructing nuclear electronics instruments, collecting and processing spectra
of experiments. In fact, the analog to digital converter is a very important key in this
system. The objective of the project is to study and construct the ADC8K block to form a
nuclear instrumentation system for gamma measurement used in nuclear engineering
training. The work is presented in two theoretical and experimental parts, in which the
characteristics and primacy of the ADC and the implementation of the channel width
uncertainty compensation (Sliding scale method) is mentioned. In order to implement the
aforementioned content, the application methods are:
Channel width modulation method to correct the uncertainty of width between
channels within the range of the ADC for enhancement of the resolution of the total energy
peak in the energy spectrum.
Successive approximation (SAR) method to improve the linearity between the
recorded count and the input signal amplitude.
2. Design and methods
2.1. The working principle of the channel width correction circuit
The role of channel width correction circuit using sliding scale method is to adjust
the channel-to-channel uniformity and to linearize the input energy amplitude. Thus, the
energy resolution of the corresponding spectral peak is improved and this method is very
effective [1] when applied to the practical ADC design used in nuclear physics
experiments. The channel width correction is shown in Figure 1.
Figure 1. Channel width correction stage
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The analog signal from the track/ hold (T / H) output will follow the statistical
distribution as the peak is scattered by the odd-even effect. The result is a poor energy
resolution and this phenomenon is overcome by the mixing of the signal T / H and the
output of the digital to analog converter (D / A). The D / A consists of a digital-to-analog
converter (DAC 0800) and an LF356 Op-amp. Once mixed, the output of the mixing layer
is transformed by the A / D converter (chip used is AD7899) converted into 13-bit binary
digits in 2.2μs. This digit is subtracted from the 8-bit binary digit (formed by the 8-4-2-1
counter using 74LS393: ½ byte); At the same time, this digit is sent to the D / A to form an
analog signal mixed at the adder. Thus, results 13bit binary digit output has been overcome
the heterogeneity of the channel width.
2.2. Design, fabricating 8K SAR ADC
2.2.1. Block structure diagram
The block diagram of the SAR 8K ADC is shown in Figure 2.
Figure 2. Block diagram of the 8K ADC
2.2.2. Operational principles and timing requirement
Unipolar positive output signal with sufficient amplitude from the spectroscopy
amplifier is sent to the ADC input. This signal circuit keeps the same status by repeated
input. Pulse stretcher of the peak expands the charge-discharge time corresponding to the
rising and falling edges of the signal. This operation is done by the hold and sampling
circuit through the C storage capacitor. The stored signal on the C-capacitor is split into
two branches. It performs two tasks: the logic pulse shaping to the logic control, which
informs the ADC7899 that the peak detection circuit has detected the peak state [2]; at the
same time, the analog signal is sent to the adding circuit. The adding circuit mixes the
TẠP CHÍ KHOA HỌC - Trường ĐHSP TPHCM Tập 15, Số 3 (2018): 11-23
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above-mentioned signal and the corrected signal about the channel width error. As a
consequence, the output signal of the adding circuit is required for the homogeneous
properties of the channels and this signal is applied to the input of the AD7899 converter
after the pulse correction has been made. Let the AD7899 converter operate, the circuit
needs a logic control. The logic controller is on duty as follows: start signal is sent to notify
this IC AD7899 knew that conversion cycle begins, then analog input signal is converted
from analog to digital. During operation, the AD7899 performs a 2.2 μs conversion cycle
that satisfies 13 bits. At the end of a cycle, the AD7899 tconverter outputs a status signal
which tells the logical control stage that the digital BCD data is ready for validation on the
internal output bus. The length of time from the beginning of conversion to the end of a 13-
bit cycle is the busy time of AD 7899; this time is expressed by the interval of Busy signal.
In addition to the Busy conversion of the AD7899, the ADC converter also has an internal
deadtime of the conversion process; therefore the ADC deattime is equal to Busy plus
internal deadtime. As a result, the total deadtime (DT) is sent to the MCD interface to
process. The 13-bit internal data at the output of AD7899 is temporarily written into the
two low (D0 ÷ D7) and high (D8 ÷ D12) data bytes. Thanks to the low valid OC signal, the
data in the two latch bytes will be active at the 13-bit ADC address output from ADC0 to
ADC12. After completing conversion, the ADC sends the DR signal to the MCD that the
data has been validated and ready to be sent to it. Assuming that the connection between
the ADC and the MCD is correct, the MCD side immediately receives the DR signal to
process the data sent by the ADC side. After the processing is complete, the MCD signal
DACC notify ADC knowing that such data set has been accepted; The second conversion
cycle was initiated [4]. This process is repeated until the required time of acquisition and
processing of the data terminates. The coversion cycle of the ADC is shown in timing
requirement in Figure 3.
Figure 3. Timing requirement of 8K ADC
TẠP CHÍ KHOA HỌC - Trường ĐHSP TPHCM Dang Lanh et al.
15
2.2.3. Flowchart and its explaining algorithm
The ADC8K flowchart is shown in Figure 4. In its initial state, the ADC is initiated.
The output signal from the spectroscopy amplifier (1) is polynomially tested, and if the
Gaussian, single, positive polarization is satisfied, the signal is repeated by the input
follower. As shown in timing requirement, the output of the follower will be converted to a
time-varying signal from the beginning of tA and the end time tB by the pulse stretcher (2).
The pulse peak stretching signal is loaded into store capacitor and through the track/hold
circuit (3), the peak of pulse (4) is detected. This peak is the first digital signal that allows
the A / D converter to recognize the start of a conversion from analog to digital. The
condition for the peak to be detected is that the track/ hold signal must satisfy the threshold
condition and the energy window. Assuming that the peak is detected, the input of the flip-
flop will be opened (5, 6) to allow the conversion beginning. The conversion cycle is
performed by the AD7899 in parallel with the 13-bit conversion time of 2.2 μs. If this
condition is met, the binary digit will be validated on the internal bus (8) at the output of
AD7899. This data will be latched in 2 bytes (low and high) through the latch enable signal
(9). For the MCD side knowing that the ADC conversion has been completed, the ADC
generates a ready signal (10) to send data to the MCD. If the data condition is not satisfied,
the ADC continues to export the data internally, whereas this data will be read when the
MCD accepts it. After completing the ADC data acceptance task, the MCD will send the
processed message (11) to the ADC. As a result, the radiation spectrum is displayed by the
application software and termination process.
Figure 4. Flowchart of ADC8K
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3. Experiments and comments
3.1. Integral Nonlinearity (INL) Test
To test the INL of the ADC8K, the experimental configuration is shown in Figure 5.
The acquisition and processing program used is MCANRI.exe (developed by VC ++) to
control the MCD8K-multichannel data processing unit.
Figure 5. Configuration for Integral Nonlinearity test
The DB2-BNC type pulse generator, Berkeley, USA generates a positive, single pole
signal, 50 ns rising time, and 20 μs falling time, lower threshold LLD ≈ 22 mV, upper limit
ULD ≈ 10000 mV. In principle, the input signal amplitude proportional to the energy and
amplitude will scan the 8192 entire channel range. To achieve that, adjustment step by step
incrementally from 0 to 10.000 mV, the number of steps to check is 40. The corresponding
value pairs of voltages and channels are listed in Table 1.
Table 1. Value of voltage-channel pairs obtained during INLADC8k test
STT
Thế
(mV)
Cr Ci ΔC STT
Thế
(mV)
Cr Ci ΔC
1 21 26 4.839 -21.161 21 4984 4321 4249.793 -71.207
2 195 164 153.665 -10.335 22 5241 4491 4469.610 -21.390
3 435 335 358.942 23.942 23 5491 4733 4683.440 -49.560
4 694 574 580.470 6.470 24 5683 4891 4847.661 -43.339
5 937 751 788.313 37.313 25 6054 5218 5164.985 -53.015
6 1195 977 1008.985 31.985 26 6272 5381 5351.445 -29.555
7 1447 1205 1224.526 19.526 27 6472 5545 5522.509 -22.491
8 1693 1401 1434.935 33.935 28 6783 5828 5788.513 -39.487
9 1942 1603 1647.909 44.909 29 7038 6059 6006.620 -52.380
10 2187 1823 1857.463 34.463 30 7375 6307 6294.863 -12.137
11 2447 2037 2079.846 42.846 31 7579 6483 6469.348 -13.652
TẠP CHÍ KHOA HỌC - Trường ĐHSP TPHCM Dang Lanh et al.
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12 2658 2231 2260.318 29.318 32 8016 6826 6843.123 17.123
13 2972 2494 2528.889 34.889 33 8275 7019 7064.651 45.651
14 3203 2687 2726.468 39.468 34 8555 7306 7304.140 -1.860
15 3436 3032 2925.757 -106.243 35 8733 7508 7456.387 -51.613
16 3673 3104 3128.468 24.468 36 9195 7814 7851.545 37.545
17 3987 3479 3397.039 -81.961 37 9317 7931 7955.894 24.894
18 4238 3648 3611.724 -36.276 38 9482 8050 8097.022 47.022
19 4507 3893 3841.805 -51.195 39 9517 8115 8126.958 11.958
20 4738 4011 4039.384 28.384 40 9519 8121 8128.669 7.669
From the table of recorded data, the first order fit and the equation of the fit line is y
= 0.85703x - 17.86172 (Figure 6),
Figure 6. The representation of the INLADC8K to be tested
where x represents the input signal amplitude, y is the expected channel number, -
17.86172 is the amplitude at the zero channel and 0.85703 is the slope of the fit line and
the coefficient is R2 = 0.99975. An INL test configuration is shown in Figure 5. From the
function of y, replacing the values xi = (21 ÷ 9519) with i from 1 to 40 and the function y =
0.85703x - 17.86172 will obtain 40 values of Ci; then, calculated ΔCmax = (Cr - Ci) max =
0.00419. Using formula INLADC8K = (ΔCmax/Cmax) x 100% [1], obtained: INLADC8k =
େౣ౮
େౣ౮
. 100% = ସ.ଶଶ
଼ଵଶଵ
.100% = 0.58% and INLRSS: INLADC8K-Canberra = 0.159%. The results
are shown in Table 2.
Table 2. Integral nonlinearity of system under test and reference standard system
No. INL% Value
1 Reference standard system using ADC8K, Canberra 0.159%
2 The system used new ADC8K 0.58%
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3.2. Differential nonlinearity (DNL) test
To test DNLADC8K, the experiment is arranged as shown in Figure 7. This
configuration consists of two independent measuring arms, the upper branch is the ADC
containing system that needs to check the technical characteristics formed from the
ADC8K, MCD8K, computer, MCANRI data acquisition application program. The lower
branch is Canberra's AMP 572A-Ortec, ADC 8701-canberra, MCD Accuspec V1.1, MCA
Series 100 application software and computer. DB2 BNC pulse generator-Berkeley gives a
positive, unipolar signal to the amplifier input AMP 572A. The shaping time of AMP is
chosen as 6 μs to reduce the effect of pulse rising time using standard pulse generators. The
cycle is as follows:
Figure 7. Configuration for DNLADC8K differential nonlinearity test
1. Set up the 50 ns rising time and 100 μs falling time in the random pulse generator.
Calibrate the output signal and select the gain of the AMP 572A so that the unipolar sweep
pulse in the MCA following the maximum amplitude range from 1% to 100% (from 0 V to
10 V with 1 second scanning period and preset time of 36000 seconds). The measurement
system is set up so that the average count is approximately 36000, reaching a value of 1
pulses per second (cps) from the generator.
2. Start the random pulse generator and data acquisition program in PHA mode. Over
time, random data is accumulated in all channels and produces continuous scanning
spectra. The differential linearity spectrum of the SUT system is shown in Figure 8. The
spectrum consists of 8K pairs of corresponding numbers between the count and the
channel and is recorded in the two-dimensional array. For the total count of 8192 channels,
the empirical formula is ∑ ܠૡૢܑୀ i = 1473706187, therefore the mean of counts is:
TẠP CHÍ KHOA HỌC - Trường ĐHSP TPHCM Dang Lanh et al.
19
Figure 8. Differential linearity spectrum of SUT using ADC8K
Nav = ݔ ഥ = 179895.7748. Apply the formula ܦܰܮ = ௱ேೌೣ
ேೌೡ
. 100% [5] and from Nav,
find the maximum deviation in 8192 deviation values:
ΔNmax = (Nx - Nav)max = 2554.52. Thus, the differential nonlinearity of ADC8K is
computed as: DNLADC8K = (2554.52/179895.7748) x 100% ≈ 1.42%. The statistical
fluctuation in Figure 9 denotes DNLADC8K differential nonlinearity.
Figure 9. Differential Nonlinearity of ADC8K
By the same way, the differential nonlinearity of the RSS system is obtained:
DNLRSS ≈ 1.1%, deadtime DTSUT = 0.49% and DTRSS = 0.41%, respectively. The
value pairs of the two systems are shown in Table 3.
Table 3. SUTADC8K and RSSAccuspec results of differential nonlinearity tests
No. Equipment
Tmeas
(s)
Vin
(mV)
Mode
tAMP
(μs)
Range Counts
DT
(%)
DNL
(%)
1 RSSAccuspec 36000 104 PHA 6 8192 179128 0.41 1.1
2 SUTADC8K 36000 104 PHA 6 8192 179012 0.49 1.42
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3.3. χ2 test
When dealing with random signals from the radiation source, the quality of the MCA
is evaluated by χ2. In the sequence n the measurement xi, the mean ̅ݔ is calculated:
Experiment for each measurement is 1000s, conduct 15 continuous measurements and can
evaluate the counting quality of the MCA system through χ2. In a series of n measures xi,
the mean value is calculated as follows: ̅ݔ = ∑ ௫భఱసభ
. Experimental variance is calculated by
the equation: s2 = ଵ
∑ (ݔୀଵ − ̅ݔ)ଶ and χ2 is calculated: χ2 = (ିଵ)௦మ௫ ഥ . Experimental values are
presented in Tables 4 and 5.
Table 4. Synthesis of statistical values to calculate χ2
i xi ࢞ − ࢞ഥ (࢞ − ࢞ഥ)2
1 89602 -145.33 21121.8
2 89996 248.67 61835.1
3 89512 -235.33 55381.8
4 89984 236.67 56011.1
5 89979 231.67 53669.4
6 89486 -261.33 68295.1
7 89993 245.67 60352.1
8 89986 238.67 56961.8
9 89481 -266.33 70933.4
10 89632 -115.33 13301.8
11 89977 229.67 52746.8
12 89502 -245.33 60188.4
13 89991 243.67 59373.4
14 89605 -142.33 20258.8
15 89484 -263.33 69344.4
̅ݔ 89747.33
(ݔ
ୀଵ
− ̅ݔ)ଶ 779775.3
s2 51985.02
χ2 8.109
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Table 5. Comparison of χ2 results of two SUT and RSS systems
STT MCA systems Value
1 2SUT 8.109
2 2RSS 7.495
3.4. Check the accuracy of counting and frequency throughput of ADC8K
The accuracy of the count of the ADC8K test system identified by configuration 5
using a DB2-BNC, Berkeley, USA pulse generator is as follows: two SUT and RSS must
be set at the same shaping time, maintain all checks and be triggered at the same time for
recording and stopping when the preset time ends; pulse generator is started by manual,
selectable frequencies are in the range from fmin = 90 Hz to fmax = 1 MHz, preset time tpr =
10000s; threshold conditions, windows to count are checked for both systems; Performing
spectrum measurements in PHA mode, operating in real time mode. The D% deviation
between the cumulative counts in the RSS system with the SUT system is called the
accuracy of their counts and is calculated by the formula: D% = େ౨ିେ౪
େ౨
. 100% [5]; where, Cr
is the number of recorded count in the RSS and Ct is the cumulative count in the SUT. As the
elapsed time passes by the preset time tpr, the measurement system automatically stops. The
results of cumulative counts over time and counting differences between the two systems are
presented in Table 6.
Table 6. Cumulative real-time counts
and counting differences between two measurement systems
No.
Meas. time Frequencies
Count Cr in
RSS
Count Ct in
SUT
Count
differences
1 tpr = 10000 s fmin = 90 Hz 898836 899437 D1 % = 0.067
2 tpr = 10000 s f = 500 Hz 4978236 4984116 D2 % = 0.118
3 tpr = 10000 s f = 1 kHz 9937265 9942387 D3 % = 0.052
4 tpr = 10000 s fmax = 200 kHz 197946537 198237482 D4 % = 0.147
5 tpr = 10000 s fmax = 700 kHz 6974822513 6989237289 D5 % = 0.207
6 tpr = 10000 s fmax = 1MHz 9824738239 9857324675 D6 % = 0.332
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3.5. Results and comments
When the technical parameters of the instrument are checked, the use of the RSS as a
basis for evaluating the operating mode as well as the reliability of the practical method is
reflected in the actual data. Experiments presented in the tables. As shown in Table 2, the
INLADC8K Integral Nonlinearity is higher approximately 3.7 times that of INLMCD8K-Accuspec,
therefore, it affects on the peak stabilization; however, since it does not exceed 1%, it is
within acceptable tolerances. In addition, R2 = 0.99975 shows a strong correlation between
the amplitude and the channel corresponding to the statistical fluctuation of 0.025%. Table
3 shows that the differential nonlinearity of the ADC8K block is relatively good as
compared to the reference DNL, the deviation is | 1.1 -1.42 | /1.1 = 0.291. It means it is
1.291 times higher than the standard reference. As such, DNLADC8K is not up to standard,
but it is acceptable [5]. For 15 χ2 test measurements, if the results of χ2 are in the range of
(3.325 ÷ 16.919), those statistics have a normal statistical fluctuation [6] with a 95%
confidence interval. Tables 4 and 5 show that χ2 of ADC8K satisfies the given condition,
so the reliability is high enough for fluctuations in counts. According to the data in Table 6,
results of checking the accuracy of counting and input frequency of ADC8K shows that the
deviation D1% ÷ D4% <0.15% is relatively good when input pulse does not exceed 200
kHz. Results shows that D5% and D6% reached 0.332%. Thus, when the input pulse
frequency is large enough (from 700kHz or more), the difference in count is relatively
higher than normal. This is one of the limitations of newly fabricated ADC8K block that
has to be overcome. Therefore, to avoid data loss and to reduce deadtime, the pulse
frequency used must be less than 700 kHz.
4. Conclusions
Study and application of the 8K ADC block method in a successive approximation
using new generation electronics components with variable time and fast acquisition of 2.2
μs. This is the most effective method has been focused on research, exploitation to
fabricate instrument according to specific objectives: successive approximation ADC,
Configuration for channel width uncertainty, D/ A conversion. Based on that, the ADC unit
has formed and put into practical application in training. The works presented tests,
discussed the experimental results of measuring and checking the parameters and technical
specifications of the instrument. Specifically, the technical characteristics of the equipment
to be tested; configuration of the reference standard system (RSS) with the system to be
evaluated (SUT) for data acquisition and calibration; the results was discussed. It can be
said that the new point of academic work is research, successful application of analog
signal conversion method of radiation events by successive approximation register (SAR)
techniques. To solve this problem, the project incorporates the use of fast-conversion
TẠP CHÍ KHOA HỌC - Trường ĐHSP TPHCM Dang Lanh et al.
23
device (2.2 μs/13 bits) with external circuits to offset channel width uncertainty to improve
the resolution of the instrument.
The ADC8K block has the following parameters and specifications: Resolution-
8192 channels; Variable time 2.2μs; The upper and lower thresholds for the ADC are
controlled by software; Input receives positive unipolar signal, amplitude range [0 ÷ 10] V;
Integral nonlinearity INLADC8K ≈ 0.58% of the full range; Differential nonlinearity
DNLADC8K ≈ 1.42% for the measuring range; χ2 = 8.109. The application of the newly
developed instrument can be used in a multichannel analyzer, Compton suppression
spectrometer, or gamma-gamma coincident spectrometer for measuring ionization
radiation.
Conflict of Interest: Authors have no conflict of interest to declare.
REFERENCES
[1] EG & G ORTEC, CAMAC ADCs, Memories and Associated Software, 1990.
[2] ADC Canberra, 8701 Multichannel Analyzer, 1999.
[3] ANALOG DEVICES, 5 V Single Supply 14-Bit 400 kSPS ADC, AD7899, 1989.
[4] CANBERRA Industries, Analog to Digital Converter Model 8701, 2007.
[5] Dang Lanh et al., In-house development of an FPGA-based MCA8K for gamma-ray
spectrometer, Doi. 10.1186/2193-1801-3-665, SpringerPlus, 2014.
[6] IAEA-TECDOC-602, Quality control of nuclear medicine instruments, Vienna, 1991.
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